Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques
Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques
ISBN:
9,78353E+12
Автор:
Отсутствует
Издательство:
John Wiley & Sons Limited (prof)
Тип:
Электронная книга
Реклама. Рекламодатель ООО "Литрес" / ИНН 7719571260 / Litres.ru / Erid: 2Vtzqx9kwnn
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
ISBN
9,78353E+12
Автор
Отсутствует
Издательство
John Wiley & Sons Limited (prof)
Тип
Электронная книга